activity
20032025
most citedGrowth and optical properties of GaN/AlN quantum wells

79 citations · 189 across the 12 of their papers we have counts for

collaborators

12 papers

cond-mat.mtrl-sci2025

Advanced structural characterization of single-walled carbon nanotubes with 4D-STEM

Antonin Louiset, Daniel Förster, Vincent Jourdain +5

Single wall carbon nanotubes (SWCNT) exhibit remarkable optical and electrical properties making them one of the most promising materials for next generation electronic and optoele…

cond-mat.mtrl-sci2024

Selective area epitaxy of in-plane HgTe nanostrcutures on CdTe(001) substrate

Nicolas Chaize, Xavier Baudry, Pierre-Henri Jouneau +10

Semiconductor nanowires are believed to play a crucial role for future applications in electronics, spintronics and quantum technologies. A potential candidate is HgTe but its sens…

cond-mat.mtrl-sci2023

Atomic scale imaging of the negative charge induced by a single vanadium dopant atom in monolayer WSe using 4D-STEM

D. Dosenovic, K. Sharma, S. Dechamps +10

There has been extensive activity exploring the doping of semiconducting two-dimensional (2D) transition metal dichalcogenides in order to tune their electronic and magnetic proper…

physics.app-ph2023★ 9 cited

Effect of extended defects on AlGaN QDs for electron-pumped UV-emitters

Jesus Cañas, Névine Rochat, Adeline Grenier +8

We study the origin of bimodal emission in AlGaN/AlN QD superlattices displaying high internal quantum efficiency (around 50%) in the 230-300 nm spectral range. The secondary emiss…

cond-mat.mtrl-sci2023

Mapping domain junctions using 4D-STEM: toward controlled properties of epitaxially grown transition metal dichalcogenide monolayers

Djordje Dosenovic, Samuel Dechamps, Celine Vergnaud +10

Epitaxial growth has become a promising route to achieve highly crystalline continuous two-dimensional layers. However, high-quality layer production with expected electrical prope…

physics.app-ph2022★ 17 cited

The influence of illumination conditions in the measurement of built-in electric field at p-n junctions by 4D-STEM

Bruno C da Silva, Zahra S Momtaz, Lucas Bruas +4

Momentum resolved 4D-STEM, also called center of mass (CoM) analysis, has been used to measure the long range built-in electric field of a silicon p-n junction. The effect of diffe…