activity
20042024
most citedX-ray diffraction peak profiles from threading dislocations in GaN epitaxial films

224 citations · 430 across the 6 of their papers we have counts for

collaborators

6 papers

cond-mat.mtrl-sci2024

Growth of compositionally uniform layers with low relaxation degree on GaN by molecular beam epitaxy

Jingxuan Kang, Mikel Gómez Ruiz, Duc Van Dinh +7

500-nm-thick layers with 0.05-0.14 are grown using plasma-assisted molecular beam epitaxy, and their properties are assessed by a…

cond-mat.mtrl-sci2023

Composition and optical properties of (In,Ga)As nanowires grown by group-III-assisted molecular beam epitaxy

M Gómez Ruiz, Aron Castro, Jesús Herranz +5

(In,Ga) alloy droplets are used to catalyse the growth of (In,Ga)As nanowires by molecular beam epitaxy on Si(111) substrates. The composition, morphology and optical properties of…

cond-mat.mtrl-sci2021★ 6 cited

Interface recombination in Ga- and N-polar GaN/(Al,Ga)N quantum wells grown by molecular beam epitaxy

Thomas Auzelle, Chiara Sinito, Jonas Lähnemann +5

We explore and systematically compare the morphological, structural and optical properties of GaN/(Al,Ga)N multiple quantum wells (MQWs) grown by plasma-assisted molecular beam epi…

cond-mat.mes-hall2012★ 55 cited

Current path in light emitting diodes based on nanowire ensembles

Friederich Limbach, Christian Hauswald, Jonas Lähnemann +8

Light emitting diodes (LEDs) were fabricated using ensembles of free-standing (In,Ga)N/GaN nanowires (NWs) grown on Si substrates in the self-induced growth mode by molecular beam…

cond-mat.mtrl-sci2005★ 145 cited

GaN:Gd: A superdilute ferromagnetic semiconductor with a Curie temperature above 300 K

S. Dhar, O. Brandt, M. Ramsteiner +2

We investigate the magnetic and magneto-optic properties of epitaxial GaN:Gd layers as a function of the external magnetic field and temperature. An unprecedented magnetic moment i…

cond-mat.mtrl-sci2004★ 224 cited

X-ray diffraction peak profiles from threading dislocations in GaN epitaxial films

V. M. Kaganer, O. Brandt, A. Trampert +1

We analyze the lineshape of x-ray diffraction profiles of GaN epitaxial layers with large densities of randomly distributed threading dislocations. The peaks are Gaussian only in t…