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20052022
most citedInductance of Circuit Structures for MIT LL Superconductor Electronics Fabrication Process with 8 Niobium Layers

77 citations · 474 across the 11 of their papers we have counts for

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physics.ins-det2016★ 59 cited

AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool

Vasili K. Semenov, Yuri A. Polyakov, Sergey K. Tolpygo

We develop an ac-biased shift register introduced in our previous work (V.K. Semenov et al., IEEE Trans. Appl. Supercond., vol. 25, no. 3, 1301507, June 2015) into a benchmark circ…