G. Bersuker

most citedNegative oxygen vacancies in HfO

_{2}

as charge traps in high-k stacks

350 citations · 350 across the 1 of their papers we have counts for

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cond-mat.mtrl-sci2006★ 350 cited

Negative oxygen vacancies in HfO $_{2}$ as charge traps in high-k stacks

J. L. Gavartin, D. Munoz Ramo, A. L. Shluger +2

We calculated the optical excitation and thermal ionization energies of oxygen vacancies in m-HfO $_{2}$ using atomic basis sets, a non-local density functional and periodic supercell…

cond-mat.mtrl-sci2004

The role of nitrogen related defects in high-k dielectric oxides: Density functional studies

J. L. Gavartin, A. S. Foster, G. I. Bersuker +1

Using ab initio density functional total energy and molecular dynamics simulations, we study the effects of various forms of nitrogen post deposition anneal (PDA) on the electric p…

Negative oxygen vacancies in HfO2​ as charge traps in high-k stacks

The role of nitrogen related defects in high-k dielectric oxides: Density functional studies

Negative oxygen vacancies in HfO $_{2}$ as charge traps in high-k stacks