172 citations · 2.2k across the 63 of their papers we have counts for
26 papers · 1 filter
In-situ Plasma Studies using a Direct Current Microplasma in a Scanning Electron Microscope
Lukas Grünewald, Dmitry Chezganov, Robin De Meyer +5
Microplasmas can be used for a wide range of technological applications and to improve our understanding of fundamental physics. Scanning electron microscopy, on the other hand, pr…
High-strain-induced local modification of the electronic properties of VO thin films
Yorick A. Birkhölzer, Kai Sotthewes, Nicolas Gauquelin +8
Vanadium dioxide (VO2) is a popular candidate for electronic and optical switching applications due to its well-known semiconductor-metal transition. Its study is notoriously chall…
Absence of a pressure gap and atomistic mechanism of the oxidation of pure Co nanoparticles
Jaianth Vijayakumar, Tatiana M. Savchenko, David M. Bracher +7
We present a detailed atomistic picture of the oxidation mechanism of Co nanoparticles and its impact on magnetism by experimentally following the evolution of the structure, chemi…
Phase Object Reconstruction for 4D-STEM using Deep Learning
Thomas Friedrich, Chu-Ping Yu, Jo Verbeeck +1
In this study we explore the possibility to use deep learning for the reconstruction of phase images from 4D scanning transmission electron microscopy (4D-STEM) data. The process c…
Reducing electron beam damage through alternative STEM scanning strategies. Part I -- Experimental findings
Abner Velazco, Daen Jannis, Armand Béché +1
The highly energetic electrons in a transmission electron microscope (TEM) can alter or even completely destroy the structure of samples before sufficient information can be obtain…
Reducing electron beam damage through alternative STEM scanning strategies. Part II -- Attempt towards an empirical model describing the damage process
D. Jannis, A. Velazco, A. Béché +1
In this second part of a series we attempt to construct an empirical model that can mimick all experimental observations made regarding the role of an alternative interleaved scan…