4 papers
Secondary electron topographical contrast formation in scanning transmission electron microscopy
Evgenii Vlasov, Wouter Heyvaert, Tom Stoops +3
Secondary electron (SE) imaging offers a powerful complementary capabilities to conventional scanning transmission electron microscopy (STEM) by providing surface-sensitive, pseudo…
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization
Daen Jannis, Wouter Van den Broek, Zezhong Zhang +2
By working out the Bethe sum rule, a boundary condition that takes the form of a linear equality is derived for the fine structure observed in ionization edges present in electron…
Unveiling the 3D Morphology of Epitaxial GaAs/AlGaAs Quantum Dots
Yiteng Zhang, Lukas Gruenewald, Xin Cao +6
Strain-free GaAs/AlGaAs semiconductor quantum dots (QDs) grown by droplet etching and nanohole infilling (DENI) are highly promising candidates for the on-demand generation of indi…
Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions
Zezhong Zhang, Ivan Lobato, Hamish Brown +5
The rich information of electron energy-loss spectroscopy (EELS) comes from the complex inelastic scattering process whereby fast electrons transfer energy and momentum to atoms, e…