125 citations · 157 across the 6 of their papers we have counts for
1 paper · 1 filter
Laurens H. Willems Van Beveren, Kuan Y. Tan, Nai-Shyan Lai +3
A common issue in low temperature measurements of enhancement-mode metal-oxide-semiconductor (MOS) field-effect transistors (FETs) in the low electron density regime is the high co…