17 citations · 35 across the 5 of their papers we have counts for
1 paper · 2 filters
F. Livet, G. Beutier, M. de Boissieu +4
Using coherent x-ray scattering, we evidenced atomic step roughness at the [111] vicinal surface of a silicon monocrystal of 0.05 degree miscut. Close to the (1/2 1/2 1/2) anti-Bra…