17 citations · 35 across the 5 of their papers we have counts for
4 papers · 1 filter
High resolution strain measurements in highly disordered materials
Mark Sutton, J. R. M. Lhermitte, F. Livet +1
The ability to measure small deformations or strains is useful for understanding many aspects of materials. Here, a new analysis of speckle diffraction peaks is presented in which…
Combined coherent x-ray micro-diffraction and local mechanical loading on copper nanocrystals
G. Beutier, M. Verdier, M. De Boissieu +6
Coherent x-ray micro-diffraction and local mechanical loading can be combined to investigate the mechanical deformation in crystalline nanostructures. Here we present measurements…
A coherent way to image dislocations
V. L. R. Jacques, S. Ravy, D. Le Bolloc'h +3
The use of coherent x-ray beams has been greatly developing for the past decades. They are now used by a wide scientific community to study biological materials, phase transitions…
Coherent scattering from silicon mocrystal surface
F. Livet, G. Beutier, M. de Boissieu +4
Using coherent x-ray scattering, we evidenced atomic step roughness at the [111] vicinal surface of a silicon monocrystal of 0.05 degree miscut. Close to the (1/2 1/2 1/2) anti-Bra…