2 papers
cond-mat.mtrl-sci2020
High resolution strain measurements in highly disordered materials
Mark Sutton, J. R. M. Lhermitte, F. Livet +1
The ability to measure small deformations or strains is useful for understanding many aspects of materials. Here, a new analysis of speckle diffraction peaks is presented in which…
cond-mat.mtrl-sci2009
Coherent scattering from silicon mocrystal surface
F. Livet, G. Beutier, M. de Boissieu +4
Using coherent x-ray scattering, we evidenced atomic step roughness at the [111] vicinal surface of a silicon monocrystal of 0.05 degree miscut. Close to the (1/2 1/2 1/2) anti-Bra…