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M. Reeves

1 paper hereh-index 15877 citations80 works total

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author position
  • last author1

Across the 1 of 1 paper where every author was matched, so the position is known.

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  • cond-mat.mtrl-sci1

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most citedParameter-free extraction of Thin-Film Dielectric Constants from Scanning Near Field Microwave Microscope Measurements

2 citations · 2 across the 1 of their papers we have counts for

collaborators

1 paper

cond-mat.mtrl-sci2009★ 2 cited

Parameter-free extraction of Thin-Film Dielectric Constants from Scanning Near Field Microwave Microscope Measurements

Shuogang Huang, H. M. Christen, M. E. Reeves

We present a method for extracting high-spatial resolution dielectric constant data at microwave frequencies. A scanning near field microwave microscope probes a sample and acquire…

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