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19992012
most citedSimultaneously imaging of dielectric properties and topography in a PbTiO_3 crystal by near-field scanning microwave microscopy

15 citations · 33 across the 4 of their papers we have counts for

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Showing 2009Show all

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cond-mat.mtrl-sci2009★ 2 cited

Parameter-free extraction of Thin-Film Dielectric Constants from Scanning Near Field Microwave Microscope Measurements

Shuogang Huang, H. M. Christen, M. E. Reeves

We present a method for extracting high-spatial resolution dielectric constant data at microwave frequencies. A scanning near field microwave microscope probes a sample and acquire…