15 citations · 33 across the 4 of their papers we have counts for
Showing cond-mat.mtrl-sciShow all
2 papers · 1 filter
cond-mat.mtrl-sci2009★ 2 cited
Parameter-free extraction of Thin-Film Dielectric Constants from Scanning Near Field Microwave Microscope Measurements
Shuogang Huang, H. M. Christen, M. E. Reeves
We present a method for extracting high-spatial resolution dielectric constant data at microwave frequencies. A scanning near field microwave microscope probes a sample and acquire…
cond-mat.mtrl-sci2000★ 15 cited
Simultaneously imaging of dielectric properties and topography in a PbTiO_3 crystal by near-field scanning microwave microscopy
Y. G. Wang, M. E. Reeves, F. J. Rachford
We use a near-field scanning microwave microscope to simultaneously image the dielectric constant, loss tangent, and topography in a PbTiO_3 crystal. By this method, we study the e…