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20242026
most citedHigh Breakdown Electric Field (> 5 MV/cm) in UWBG AlGaN Transistors

13 citations · 24 across the 8 of their papers we have counts for

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5 papers · 1 filter

physics.app-ph2026

Integration of p-type Cr2O3 on Ultra-Wide Bandgap AlGaN PolFETs with 2.5 kV Breakdown Voltage

Jonathan Pratt, Yizheng Liu, Ijaas Mohamed +8

We demonstrate UWBG AlGaN polarization-graded field-effect transistors (PolFETs) incorporating room-temperature sputtered p-type oxide Cr2O3 as a P-N heterojunction gate, enabling…

physics.app-ph2026

Vertical Gallium Oxide Isolated Source Electrode Field Effect Transistors (ISEFET) Without Planarization or Mid-Gap Acceptor Blocking Layers

Akilesh Srikanth, Md Saklain Morshed, Chandan Joishi +2

We propose and demonstrate the first vertical Gallium oxide device architecture without the use of planarization etch back processes or mid-gap acceptor regions. The Isolated Sourc…

physics.app-ph2024

Selective-injection GaN Heterojunction Bipolar Transistors with 275 kA/cm Current Density

Zhanbo Xia, Chandan Joishi, Shahadat H. Sohel +4

We design and demonstrate selective injection GaN heterojunction bipolar transistors that utilize a patterned base for selective injection of electrons from the emitter. The design…

physics.app-ph2024★ 1 cited

Tunnel Junction-Enabled Monolithically Integrated GaN Micro-Light Emitting Transistor

Sheikh Ifatur Rahman, Mohammad Awwad, Chandan Joishi +4

GaN/InGaN microLEDs are a very promising technology for next generation displays. Switching control transistors and their integration are key components in achieving high-performan…

physics.app-ph2024

Design and Simulation of a III-Nitride Light Emitting Transistor

Mohammad Awwad, Sheikh Ifatur Rahman, Chandan Joishi +2

This paper describes the design and characteristics of monolithically integrated three-terminal gated III-Nitride light emitting diodes (LEDs) devices. The impact of channel doping…