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20072026
most citedDual-Frequency Resonance-Tracking Atomic Force Microscopy

497 citations · 1.2k across the 22 of their papers we have counts for

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Showing cond-mat.mtrl-sciShow all

5 papers · 1 filter

cond-mat.mtrl-sci2026

Correlated domain and crystallographic orientation mapping in uniaxial ferroelectric polycrystals by interferometric vector piezoresponse force microscopy

Ruben Dragland, Jan Schultheiß, Ivan N. Ushakov +2

Ongoing advances in scanning probe microscopy techniques are continually expanding the possibilities for nanoscale characterization and correlated studies of functional materials.…

cond-mat.mtrl-sci2024

Reward based optimization of resonance-enhanced piezoresponse spectroscopy

Yu Liu, Boris Slautin, Jason Bemis +6

Dynamic spectroscopies in Scanning Probe Microscopy (SPM) are critical for probing material properties, such as force interactions, mechanical properties, polarization switching, a…

cond-mat.mtrl-sci2024★ 7 cited

Integration of Scanning Probe Microscope with High-Performance Computing: fixed-policy and reward-driven workflows implementation

Yu Liu, Utkarsh Pratiush, Jason Bemis +8

The rapid development of computation power and machine learning algorithms has paved the way for automating scientific discovery with a scanning probe microscope (SPM). The key ele…

cond-mat.mtrl-sci2007★ 453 cited

The Band Excitation Method in Scanning Probe Microscopy for Rapid Mapping of Energy Dissipation on the Nanoscale

Stephen Jesse, Sergei V. Kalinin, Roger Proksch +2

Mapping energy transformation pathways and dissipation on the nanoscale and understanding the role of local structure on dissipative behavior is a challenge for imaging in areas ra…

cond-mat.mtrl-sci2007★ 497 cited

Dual-Frequency Resonance-Tracking Atomic Force Microscopy

B J Rodriguez, C Callahan, S V Kalinin +1

A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at…