497 citations · 1.2k across the 22 of their papers we have counts for
22 papers
High Speed Contact-Resonance Tracking using Brownian motion
J. Bemis, R. Proksch
Contact-resonance atomic force microscopy (CR-AFM) provides nanoscale maps of contact stiffness, dissipation, and electromechanical response, but conventional piezoacoustic excitat…
Correlated domain and crystallographic orientation mapping in uniaxial ferroelectric polycrystals by interferometric vector piezoresponse force microscopy
Ruben Dragland, Jan Schultheiß, Ivan N. Ushakov +2
Ongoing advances in scanning probe microscopy techniques are continually expanding the possibilities for nanoscale characterization and correlated studies of functional materials.…
Hidden Information in Force Curves: Transient- and Brownian-Driven Dynamics
Sergio Santos, Roger Proksch
Force distance curves (FCs) are direct probes of tip sample interactions in atomic force microscopy, but their dynamic content is often suppressed by filtering, averaging and quasi…
iDART: Interferometric Dual-AC Resonance Tracking nano-electromechanical mapping
J. Bemis, F. Wunderwald, U. Schroeder +3
Piezoresponse force microscopy (PFM) has established itself as a very successful and reliable imaging and spectroscopic tool for measuring a wide variety of nanoscale electromechan…
Lateral force microscopy calibration using an interferometric atomic force microscope
Joel Lefever, Aleksander Labuda, Roger Proksch
A new method is introduced for calibrating lateral force as measured by an atomic force microscope (AFM), making use of both an interferometric detector and an optical beam detecto…
Reward based optimization of resonance-enhanced piezoresponse spectroscopy
Yu Liu, Boris Slautin, Jason Bemis +6
Dynamic spectroscopies in Scanning Probe Microscopy (SPM) are critical for probing material properties, such as force interactions, mechanical properties, polarization switching, a…