497 citations · 1.2k across the 22 of their papers we have counts for
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High Speed Contact-Resonance Tracking using Brownian motion
J. Bemis, R. Proksch
Contact-resonance atomic force microscopy (CR-AFM) provides nanoscale maps of contact stiffness, dissipation, and electromechanical response, but conventional piezoacoustic excitat…
Hidden Information in Force Curves: Transient- and Brownian-Driven Dynamics
Sergio Santos, Roger Proksch
Force distance curves (FCs) are direct probes of tip sample interactions in atomic force microscopy, but their dynamic content is often suppressed by filtering, averaging and quasi…
iDART: Interferometric Dual-AC Resonance Tracking nano-electromechanical mapping
J. Bemis, F. Wunderwald, U. Schroeder +3
Piezoresponse force microscopy (PFM) has established itself as a very successful and reliable imaging and spectroscopic tool for measuring a wide variety of nanoscale electromechan…
Lateral force microscopy calibration using an interferometric atomic force microscope
Joel Lefever, Aleksander Labuda, Roger Proksch
A new method is introduced for calibrating lateral force as measured by an atomic force microscope (AFM), making use of both an interferometric detector and an optical beam detecto…
3D Nanoscale Electromechanical Imaging with Interferometric Atomic Force Microscopy
Roger Proksch, Ryan Wagner
Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extend…
Machine Learning-Based Reward-Driven Tuning of Scanning Probe Microscopy: Towards Fully Automated Microscopy
Yu Liu, Roger Proksch, Jason Bemis +8
Since the dawn of scanning probe microscopy (SPM), tapping or intermittent contact mode has been one of the most widely used imaging modes. Manual optimization of tapping mode not…