most citedEffect of SOI substrate on silicon nitride resistance switching using MIS structure

12 citations · 46 across the 14 of their papers we have counts for

collaborators

14 papers

cond-mat.mes-hall2025

Impact of interdigitated electrodes design on the low frequency and random telegraph noise of single-layer graphene micro ribbons

Georgia Samara, Christoforos Theodorou, Alexandros Mavropoulis +3

High performance devices consisting of interdigitated electrodes (IDEs) on top of single-layer graphene (SLG) are candidates with favorable prospects for sensing applications. Grap…

cond-mat.mtrl-sci2025★ 1 cited

Resistance Switching Properties of Stoichiometric and Nitrogen Implanted Silicon Nitride Nanolayers on N and P-Type Si Substrates

A. E. Mavropoulis, P. Karakolis, N. Vasileiadis +6

This paper examines the resistive switching characteristics of LPCVD SiNx MNOS ReRAM cells on both heavily doped n- and p-type silicon substrates, focusing on the effects of nitrog…

cond-mat.mtrl-sci2025★ 2 cited

Breakdown characteristics of SiNx with different stoichiometries for resistive memories

A. E. Mavropoulis, I. Kanellopoulos, G. Pissanos +6

The breakdown characteristics of SiNx layers with different stoichiometries are explored. The stoichiometry of SiNx is modified by changing the gas flow rates during the LPCVD depo…

cond-mat.mtrl-sci2025★ 3 cited

SiNx RRAMs performance with different stoichiometries

A. E. Mavropoulis, G. Pissanos, N. Vasileiadis +3

The microstructure of SiNx is strongly affected by its stoichiometry, x. The stoichiometry of SiNx thin films can be modified by adjusting the gas flow rates during LPCVD depositio…

cond-mat.mtrl-sci2025

The Role of Tunneling Oxide in the Low Frequency Noise of Multi-level Silicon Nitride ReRAMs

Nikolaos Vasileiadis, Alexandros Mavropoulis, Christoforos Theodorou +1

This research explores the characteristics of two CMOS-compatible RRAM cells utilizing silicon nitride as the switching material. By employing SET/RESET pulse sequences, the study…

physics.app-ph2025★ 1 cited

Synaptic MIS Silicon Nitride Resistance Switching Memory Cells on SOI Substrate

AE Mavropoulis, N Vasileiadis, P Normand +4

In this work, the comparison of resistive memory MIS single-cells without selector (1R), having silicon nitride as switching dielectric, fabricated on SOI and bulk Si wafers is dem…

physics.app-ph2025★ 4 cited

Random Telegraph Noise of MIS and MIOS Silicon Nitride memristors at different resistance states

N Vasileiadis, P Loukas, A Mavropoulis +4

Resistive memories (RRAM) are promising candidates for replacing present nonvolatile memories and realizing storage class memories; hence resistance switching devices are of partic…

physics.app-ph2025★ 4 cited

Novel crossbar array of silicon nitride resistive memories on SOI enables memristor rationed logic

N Vasileiadis, A Mavropoulis, I Karafyllidis +2

In this work, the fabrication of crossbar arrays of silicon nitride resistive memories on silicon-on-insulator substrate and their utilization to realize multi-rationed logic circu…

physics.app-ph2025★ 12 cited

Effect of SOI substrate on silicon nitride resistance switching using MIS structure

A Mavropoulis, N Vasileiadis, C Theodorou +4

Several resistive memory technologies (RRAMs) are prominent, but few are fulfilling the requirements for CMOS integration and meet the commercialization standards. In this work, th…

physics.app-ph2025★ 6 cited

Analysis of random telegraph noise in resistive memories: The case of unstable filaments

Nikolaos Vasileiadis, Alexandros Mavropoulis, Panagiotis Loukas +2

Through Random Telegraph Noise (RTN) analysis, valuable information can be provided about the role of defect traps in fine tuning and reading of the state of a nanoelectronic devic…

cond-mat.mtrl-sci2025★ 6 cited

Silicon nitride resistance switching MIS cells doped with silicon atoms

A Mavropoulis, N Vasileiadis, C Bonafos +4

Stoichiometric SiNx layers (x = [N]/[Si] = 1.33) are doped with Si atoms by ultra-low energy ion implantation (ULE-II) and subsequently annealed at different temperatures in inert…

physics.app-ph2025★ 3 cited

Effect of Silicon Atom Doping in SiNx Resistive Switching Films

A Mavropoulis, N Vasileiadis, C Bonafos +4

Doping stoichiometric SiNx layers (x=[N]/[Si]=1.33) with Si atoms by ultra-low energy ion implantation (ULE-II) and annealing them at different temperatures can significantly impac…

physics.app-ph2025★ 2 cited

1/f and Random Telegraph Noise of Single-Layer Graphene Devices with Interdigitated Electrodes

Georgia Samara, Nikolaos Vasileiadis, Alexandros Mavropoulis +3

Single-layer Graphene (SLG) is a promising material for sensing applications. High performance graphene sensors can be achieved when Interdigitated Electrodes (IDE) are used. In th…

physics.app-ph2025★ 2 cited

Effect of Al2O3 on the operation of SiNX-based MIS RRAMs

A. E. Mavropoulis, N. Vasileiadis, P. Normand +4

The role of a 3 nm Al2O3 layer on top of stoichiometric LPCVD SiNx MIS RRAM cells is investigated by using various electrical characterization techniques. The conductive filament f…