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cond-mat.mtrl-sci2026
Atomic-scale composition of the ternary III-V semiconductor (Al,Ga)Sb visualized by cross-sectional scanning tunneling microscopy
Hitesh Kumar, Vladimir Kaganer, Zijin Lei +3
Cross-sectional scanning tunneling microscopy at 5 K is used to investigate cation mixing in (Al,Ga)Sb layers grown by molecular beam epitaxy, via direct atom counting at the (1-10…
cond-mat.mtrl-sci2026
Impact of Layer Structure and Strain on Morphology and Electronic Properties of InAs Quantum Wells on InP (001)
Zijin Lei, Yuze Wu, Christian Reichl +2
High-quality InAs quantum wells grown on InP are a promising platform for topological quantum information processing due to their large g-factor, strong Rashba spin-orbit interacti…