14 citations · 14 across the 1 of their papers we have counts for
2 papers
physics.gen-ph2008
Joule Expansion Imaging Techniques on Microlectronic Devices
S. Grauby, L. -D. Patino Lopez, A. Salhi +4
We have studied the electrically induced off-plane surface displacement on two microelectronic devices using Scanning Joule Expansion Microscopy (SJEM). We present the experimental…
physics.class-ph2007★ 14 cited
Temperature measurement of sub-micrometric ICs by scanning thermal microscopy
S. Gomès, Po Chapuis, F. Nepveu +7
Surface temperature measurements were performed with a Scanning Thermal Microscope mounted with a thermoresistive wire probe of micrometrSurface temperature measurements were perfo…