activity
20072022
most citedInfluence of generated defects by Ar-implantation on the thermoelectric properties of ScN

26 citations · 59 across the 4 of their papers we have counts for

collaborators

5 papers

cond-mat.mtrl-sci2022★ 26 cited

Influence of generated defects by Ar-implantation on the thermoelectric properties of ScN

R. Burcea, J. -F. Barbot, P. -O. Renault +9

Nowadays, making thermoelectric materials more efficient in energy conversion is still a challenge. In this work, to reduce the thermal conductivity and thus improve the overall th…

physics.optics2018★ 1 cited

Attenuation of slow Metal-Insulator-Metal plasmonic waveguides, from Joule absorption to roughness-induced backscattering

Stephane Coudert, Guillaume Duchateau, Stefan Dilhaire +1

By combining analytical and numerical approaches, we theoretically investigate the effect of fabrication imperfections, e.g. roughness at metal interfaces, on nanometer metal-insul…

physics.optics2014★ 18 cited

Anomalous light absorption around subwavelength apertures in metal films

O. Lozan, M. Perrin, B. Ea-Kim +3

In this work, we study the heat dissipated at metal surfaces by the electromagnetic field scattered by isolated subwavelength apertures in metal screens. In contrast to our common…

physics.gen-ph2008

Joule Expansion Imaging Techniques on Microlectronic Devices

S. Grauby, L. -D. Patino Lopez, A. Salhi +4

We have studied the electrically induced off-plane surface displacement on two microelectronic devices using Scanning Joule Expansion Microscopy (SJEM). We present the experimental…

physics.class-ph2007★ 14 cited

Temperature measurement of sub-micrometric ICs by scanning thermal microscopy

S. Gomès, Po Chapuis, F. Nepveu +7

Surface temperature measurements were performed with a Scanning Thermal Microscope mounted with a thermoresistive wire probe of micrometrSurface temperature measurements were perfo…