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cs.CV2024★ 1 cited
Utilizing the Mean Teacher with Supcontrast Loss for Wafer Pattern Recognition
Qiyu Wei, Xun Xu, Zeng Zeng +1
The patterns on wafer maps play a crucial role in helping engineers identify the causes of production issues during semiconductor manufacturing. In order to reduce costs and improv…
cs.CV2024
Improving Adversarial Robustness for 3D Point Cloud Recognition at Test-Time through Purified Self-Training
Jinpeng Lin, Xulei Yang, Tianrui Li +1
Recognizing 3D point cloud plays a pivotal role in many real-world applications. However, deploying 3D point cloud deep learning model is vulnerable to adversarial attacks. Despite…
cs.CV2024
A Timely Survey on Vision Transformer for Deepfake Detection
Zhikan Wang, Zhongyao Cheng, Jiajie Xiong +4
In recent years, the rapid advancement of deepfake technology has revolutionized content creation, lowering forgery costs while elevating quality. However, this progress brings for…