most citedUtilizing the Mean Teacher with Supcontrast Loss for Wafer Pattern Recognition

1 citations · 1 across the 3 of their papers we have counts for

collaborators

7 papers

cs.CV2025

Exploiting Vision Language Model for Training-Free 3D Point Cloud OOD Detection via Graph Score Propagation

Tiankai Chen, Yushu Li, Adam Goodge +4

Out-of-distribution (OOD) detection in 3D point cloud data remains a challenge, particularly in applications where safe and robust perception is critical. While existing OOD detect…

cs.CV2025

SODA: Out-of-Distribution Detection in Domain-Shifted Point Clouds via Neighborhood Propagation

Adam Goodge, Xun Xu, Bryan Hooi +4

As point cloud data increases in prevalence in a variety of applications, the ability to detect out-of-distribution (OOD) point cloud objects becomes critical for ensuring model sa…

cs.CV2025

Multi-View Industrial Anomaly Detection with Epipolar Constrained Cross-View Fusion

Yifan Liu, Xun Xu, Shijie Li +2

Multi-camera systems provide richer contextual information for industrial anomaly detection. However, traditional methods process each view independently, disregarding the compleme…

cs.CV2025

Global-Aware Monocular Semantic Scene Completion with State Space Models

Shijie Li, Zhongyao Cheng, Rong Li +4

Monocular Semantic Scene Completion (MonoSSC) reconstructs and interprets 3D environments from a single image, enabling diverse real-world applications. However, existing methods a…

cs.CV2025

Future-Aware Interaction Network For Motion Forecasting

Shijie Li, Xun Xu, Si Yong Yeo +1

Motion forecasting is a crucial component of autonomous driving systems, enabling the generation of accurate and smooth future trajectories to ensure safe navigation to the destina…

cs.CV20241 cited

Utilizing the Mean Teacher with Supcontrast Loss for Wafer Pattern Recognition

Qiyu Wei, Xun Xu, Zeng Zeng +1

The patterns on wafer maps play a crucial role in helping engineers identify the causes of production issues during semiconductor manufacturing. In order to reduce costs and improv…