most citedMFRL-BI: Design of a Model-free Reinforcement Learning Process Control Scheme by Using Bayesian Inference

1 citations · 1 across the 2 of their papers we have counts for

collaborators
Showing stat.MLShow all

1 paper · 1 filter

stat.ML2024

Tensor-based process control and monitoring for semiconductor manufacturing with unstable disturbances

Yanrong Li, Juan Du, Fugee Tsung +1

With the development and popularity of sensors installed in manufacturing systems, complex data are collected during manufacturing processes, which brings challenges for traditiona…