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cs.LG2022
DeepTPI: Test Point Insertion with Deep Reinforcement Learning
Zhengyuan Shi, Min Li, Sadaf Khan +4
Test point insertion (TPI) is a widely used technique for testability enhancement, especially for logic built-in self-test (LBIST) due to its relatively low fault coverage. In this…
cs.LG2022★ 8 cited
LHNN: Lattice Hypergraph Neural Network for VLSI Congestion Prediction
Bowen Wang, Guibao Shen, Dong Li +7
Precise congestion prediction from a placement solution plays a crucial role in circuit placement. This work proposes the lattice hypergraph (LH-graph), a novel graph formulation f…
cs.LG2021
Testability-Aware Low Power Controller Design with Evolutionary Learning
Min Li, Zhengyuan Shi, Zezhong Wang +3
XORNet-based low power controller is a popular technique to reduce circuit transitions in scan-based testing. However, existing solutions construct the XORNet evenly for scan chain…