most citedAutomated crystal orientation mapping by precession electron diffraction assisted four-dimensional scanning transmission electron microscopy (4D-STEM) using a scintillator based CMOS detector

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physics.ins-det2021★ 29 cited

Automated crystal orientation mapping by precession electron diffraction assisted four-dimensional scanning transmission electron microscopy (4D-STEM) using a scintillator based CMOS detector

Jiwon Jeong, Niels Cautaerts, Gerhard Dehm +1

The recent development of electron sensitive and pixelated detectors has attracted the use of four-dimensional scanning transmission electron microscopy (4D-STEM). Here, we present…