2 papers
physics.ins-det2021
Automated crystal orientation mapping by precession electron diffraction assisted four-dimensional scanning transmission electron microscopy (4D-STEM) using a scintillator based CMOS detector
Jiwon Jeong, Niels Cautaerts, Gerhard Dehm +1
The recent development of electron sensitive and pixelated detectors has attracted the use of four-dimensional scanning transmission electron microscopy (4D-STEM). Here, we present…
cond-mat.mtrl-sci2021
Investigation of the orientation relationship between nano-sized G-phase precipitates and austenite with scanning nano-beam electron diffraction using a pixelated detector
Niels Cautaerts, Edgar F. Rauch, Jiwon Jeong +2
Scanning nano-beam electron diffraction with a pixelated detector was employed to investigate the orientation relationship of nanometer sized, irradiation induced G-phase (MNi$…