28 citations · 51 across the 4 of their papers we have counts for
3 papers · 1 filter
Understanding the impact of heavy ions and tailoring the optical properties of large-area Monolayer WS2 using Focused Ion Beam
Fahrettin Sarcan, Nicola J. Fairbairn, Panaiot Zotev +10
Focused ion beam (FIB) has been used as an effective tool for precise nanoscale fabrication. It has recently been employed to tailor defect engineering in functional nanomaterials…
Zero Bias Power Detector Circuits based on MoS Field Effect Transistors on Wafer-Scale Flexible Substrates
Eros Reato, Paula Palacios, Burkay Uzlu +13
We demonstrate the design, fabrication, and characterization of wafer-scale, zero-bias power detectors based on two-dimensional MoS field effect transistors (FETs). The MoS…
Vertical GaN Devices: Process and Reliability
Shuzhen You, Karen Geens, Matteo Borga +14
This paper reviews recent progress and key challenges in process and reliability for high-performance vertical GaN transistors and diodes, focusing on the 200 mm CMOS-compatible te…