51 citations · 100 across the 3 of their papers we have counts for
3 papers
cond-mat.mtrl-sci2023★ 18 cited
Unveiling microstructural damage for leakage current degradation in SiC Schottky diode after heavy ions irradiation under 200 V
Xiaoyu Yan, Pengfei Zhai, Chen Yang +8
Single-event burnout and single-event leakage current (SELC) in SiC power devices induced by heavy ions severely limit their space application, and the underlying mechanism is stil…
cond-mat.mtrl-sci2021★ 51 cited
Degradiation of -GaO Schottky barrier diode under swift heavy ion irradiation
Wen-Si Ai, Jie Liu, Qian Feng +8
The electrical characteristics and microstructures of -GaO Schottky barrier diode (SBD) devices irradiated with swift heavy ions (2096 MeV Ta ions) have been studied. It…
physics.app-ph2018★ 31 cited
Fine structure of swift heavy ion track in rutile TiO2
Pengfei Zhai, Shuai Nan, Lijun Xu +7
We report on the first observation of fine structure of latent tracks in rutile TiO2, which changes from cylinder to dumbbell-shape and then to sandglass-shape as a function of the…