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cond-mat.mes-hall2025
Investigation of Low Frequency Noise in CryoCMOS devices through Statistical Single Defect Spectroscopy
Edoardo Catapano, Anirudh Varanasi, Philippe Roussel +9
High 1/f noise in CryoCMOS devices is a critical parameter to keep under control in the design of complex circuits for low temperatures applications. Current models predict the 1/f…
cond-mat.mes-hall2014★ 58 cited
NBTI in Nanoscale MOSFETs - The Ultimate Modeling Benchmark
Tibor Grasser, Karina Rott, Hans Reisinger +3
After nearly half a century of research into the bias temperature instability (BTI), two classes of models have emerged as the strongest contenders: one class of models, the reacti…