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cond-mat.mtrl-sci2018
Automated image acquisition for low-dose STEM at atomic resolution
Andreas Mittelberger, Christian Kramberger, Christoph Hofer +2
Beam damage is a major limitation in electron microscopy that becomes increasingly severe at higher resolution. One possible route to circumvent radiation damage, which forms the b…
cond-mat.mtrl-sci2018
Competing dynamics of single phosphorus dopant in graphene with electron irradiation
Cong Su, Mukesh Tripathi, Qing-Bo Yan +10
Atomic-level structural changes in materials are important but challenging to study. Here, we demonstrate the dynamics and the possibility of manipulating a phosphorus dopant atom…