367 citations · 795 across the 15 of their papers we have counts for
16 papers
Phase offset method of ptychographic contrast reversal correction
Christoph Hofer, Chuang Gao, Tamazouzt Chennit +2
The contrast transfer function of direct ptychography methods such as the single side band (SSB) method are single signed, yet these methods still sometimes exhibit contrast revers…
Reliable phase quantification in focused probe electron ptychography of thin materials
Christoph Hofer, Timothy J. Pennycook
Electron ptychography provides highly sensitive, dose efficient phase images which can be corrected for aberrations after the data has been acquired. This is crucial when very prec…
On central focusing for contrast optimization in direct electron ptychography of thick samples
C. Gao, C. Hofer, T. J. Pennycook
Ptychography provides high dose efficiency images that can reveal light elements next to heavy atoms. However, despite ptychography having an otherwise single signed contrast trans…
Detecting charge transfer at defects in 2D materials with electron ptychography
Christoph Hofer, Jacob Madsen, Toma Susi +1
Electronic charge transfer at the atomic scale can reveal fundamental information about chemical bonding, but is far more challenging to directly image than the atomic structure. T…
Overcoming contrast reversals in focused probe ptychography of thick materials: an optimal pipeline for efficiently determining local atomic structure in materials science
C. Gao, C. Hofer, D. Jannis +3
Ptychography provides highly efficient imaging in scanning transmission electron microscopy (STEM), but questions have remained over its applicability to strongly scattering sample…
Aligned Stacking of Nanopatterned 2D materials -- Towards 3D printing at atomic resolution
Jonas Haas, Finn Ulrich, Christoph Hofer +3
Two-dimensional materials can be combined by placing individual layers on top of each other, so that they are bound only by their van der Waals interaction. The sequence of layers…
Towards Exotic Layered Materials: 2D Cuprous Iodide
Kimmo Mustonen, Christoph Hofer, Peter Kotrusz +10
Heterostructures composed of two-dimensional (2D) materials are already opening many new possibilities in such fields of technology as electronics and magnonics, but far more could…
Picometer-precision few-tilt ptychotomography of 2D materials
Christoph Hofer, Kimmo Mustonen, Viera Skakalova +1
From ripples to defects, edges and grain boundaries, the 3D atomic structure of 2D materials is critical to their properties. However the damage inflicted by conventional 3D analys…
Event driven 4D STEM acquisition with a Timepix3 detector: microsecond dwell time and faster scans for high precision and low dose applications
Daen Jannis, Christoph Hofer, Chuang Gao +4
Four dimensional scanning transmission electron microscopy (4D STEM) records the scattering of electrons in a material in great detail. The benefits offered by 4D STEM are substant…
High-resolution remote thermography using luminescent low-dimensional tin-halide perovskites
Sergii Yakunin, Bogdan M. Benin, Yevhen Shynkarenko +6
While metal-halide perovskites have recently revolutionized research in optoelectronics through a unique combination of performance and synthetic simplicity, their low-dimensional…
Direct visualization of the 3D structure of silicon impurities in graphene
Christoph Hofer, Viera Skakalova, Mohammad Reza Ahmadpour Monazam +4
We directly visualize the three-dimensional (3D) geometry and dynamics of silicon impurities in graphene as well as their dynamics by aberration-corrected scanning transmission ele…
Revealing the 3D Structure of Graphene Defects
Christoph Hofer, Christian Kramberger, Mohammad Reza Ahmadpour Monazam +5
We demonstrate insights into the three-dimensional structure of defects in graphene, in particular grain boundaries, obtained via a new approach from two transmission electron micr…
Analysis of point defects in graphene using low dose scanning transmission electron microscopy imaging and maximum likelihood reconstruction
Christian Kramberger, Andreas Mittelberger, Christoph Hofer +1
Freestanding graphene displays an outstanding resilience to electron irradiation at low electron energies. Point defects in graphene are, however, subject to beam driven dynamics.…
Automated image acquisition for low-dose STEM at atomic resolution
Andreas Mittelberger, Christian Kramberger, Christoph Hofer +2
Beam damage is a major limitation in electron microscopy that becomes increasingly severe at higher resolution. One possible route to circumvent radiation damage, which forms the b…
Competing dynamics of single phosphorus dopant in graphene with electron irradiation
Cong Su, Mukesh Tripathi, Qing-Bo Yan +10
Atomic-level structural changes in materials are important but challenging to study. Here, we demonstrate the dynamics and the possibility of manipulating a phosphorus dopant atom…
Isotope analysis in the transmission electron microscope
Toma Susi, Christoph Hofer, Giacomo Argentero +5
The Ångström-sized probe of the scanning transmission electron microscope can visualize and collect spectra from single atoms. This can unambiguously resolve the chemical structure…