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physics.optics2025
Using Aberrations to Improve Dose-Efficient Tilt-corrected 4D-STEM Imaging
Desheng Ma, David A Muller, Steven E Zeltmann
Tilt-corrected imaging methods in four-dimensional scanning transmission electron microscopy (4D-STEM) have recently emerged as a new class of direct ptychography methods that are…
physics.optics2025★ 2 cited
Information in 4D-STEM: Where it is, and How to Use it
Desheng Ma, Guanxing Li, David A Muller +1
Contrast transfer mechanisms for electron scattering have been extensively studied in transmission electron microscopy. Here we revisit H. Rose's generalized contrast formalism fro…