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Near-Field Microwave Microscopy of Materials Properties
Steven M. Anlage, D. E. Steinhauer, B. J. Feenstra +2
Near-field microwave microscopy has created the opportunity for a new class of electrodynamics experiments of materials. Freed from the constraints of traditional microwave optics,…
Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope
Steven M. Anlage, D. E. Steinhauer, C. P. Vlahacos +5
We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 m. The micros…
Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions
B. J. Feenstra, C. P. Vlahacos, Ashfaq S. Thanawalla +4
We describe the near-field microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two poss…
Quantitative topographic imaging using a near-field scanning microwave microscope
C. P. Vlahacos, D. E. Steinhauer, S. K. Dutta +3
We describe a technique for extracting topographic information using a scanning near-field microwave microscope. By monitoring the shift of the system's resonant frequency, we obta…
Quantitative Imaging of Sheet Resistance with a Scanning Near-Field Microwave Microscope
D. E. Steinhauer, C. P. Vlahacos, S. K. Dutta +3
We describe quantitative imaging of the sheet resistance of metallic thin films by monitoring frequency shift and quality factor in a resonant scanning near-field microwave microsc…