Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions
arXiv:cond-mat/9802293 · doi:10.1109/MWSYM.1998.705152
Abstract
We describe the near-field microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two possible configurations, allowing a quantitative study of either material properties or local electric fields.
4 pages, 8 figures, minor corrections to text and 2 figures