2 papers
cond-mat.supr-con2026
Multiple Andreev Reflection Effects in Asymmetric STM Josephson Junctions
Wan-Ting Liao, S. K. Dutta, R. E. Butera +3
We have examined the electrical behavior of Josephson junctions formed by a scanning tunneling microscope (STM) with a Nb sample and a Nb tip, with normal-state resistances Rn vary…
cond-mat.mtrl-sci1998
Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions
B. J. Feenstra, C. P. Vlahacos, Ashfaq S. Thanawalla +4
We describe the near-field microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two poss…