activity
20172025
most citedReconstructing Detailed Line Profiles of Lamellar Gratings from GISAXS Patterns with a Maxwell Solver

39 citations · 78 across the 7 of their papers we have counts for

collaborators

7 papers

physics.optics2025

High-quality Blazed Gratings through Synergy between E-Beam lithography and Robust Characterisation Techniques

Analía F. Herrero, Nazanin Samadi, Andrey Sokolov +8

Maintaining the highest quality and output of photon science in the VUV-, EUV-, soft- and tender-X-ray energy ranges requires high-quality blazed profile gratings. Currently, their…

cond-mat.mtrl-sci2025

Wafer-scale Synthesis of Mithrene and its Application in 2D Heterostructure UV Photodetectors

Maryam Mohammadi, Stefanie L. Stoll, Analía F. Herrero +6

Silver phenylselenide (AgSePh), known as mithrene, is a two-dimensional (2D) organic-inorganic chalcogenide (MOC) semiconductor with a wide direct band gap, narrow blue emission an…

physics.comp-ph2024

Polygon-based unified Fourier-modal approach for diffractive optics simulations

K. V. Nikolaev, V. Soltwisch, M. A. Botchev +4

In this article, we derive a theoretical formalism that unifies the rigorous coupled wave analysis and the dynamical diffraction theory. Based on this formalism, we design a comput…

physics.app-ph2021★ 19 cited

On uncertainties in the reconstruction of nanostructures in EUV scatterometry and grazing incidence small-angle X-ray scattering

Analía Fernández Herrero, Victor Soltwisch, Mika Pflüger +2

Increasing miniaturization and complexity of nanostructures require innovative metrology solutions with high throughput that can assess complex 3D structures in a non-destructive m…

physics.app-ph2019★ 12 cited

Extracting Dimensional Parameters of Gratings Produced with Self-Aligned Multiple Patterning Using GISAXS

Mika Pflüger, R. Joseph Kline, Analía Fernández Herrero +3

Background: To ensure consistent and high-quality semiconductor production at future logic nodes, additional metrology tools are needed. For this purpose, grazing-incidence small-a…

physics.app-ph2018★ 8 cited

Characteristic diffuse scattering from distinct line roughnesses

Analía Fernández Herrero, Mika Pflüger, Frank Scholze +1

Lamellar gratings are widely used diffractive optical elements; gratings etched into Si can be used as structural elements or prototypes of structural elements in integrated electr…

physics.comp-ph2017★ 39 cited

Reconstructing Detailed Line Profiles of Lamellar Gratings from GISAXS Patterns with a Maxwell Solver

Victor Soltwisch, Analia Fernandez Herrero, Mika Pflüger +5

Laterally periodic nanostructures were investigated with grazing incidence small angle X-ray scattering (GISAXS) by using the diffraction patterns to reconstruct the surface shape.…