activity
19992011
most citedDetermination of the magnetization scaling exponent for single crystal LaSrMnO by broadband microwave surface impedance measurements

93 citations · 231 across the 6 of their papers we have counts for

collaborators

6 papers

cond-mat.mtrl-sci2011★ 36 cited

Near-field scanning microwave microscope for interline capacitance characterization of nanoelectronics interconnect

Vladimir V. Talanov, Andrew R. Schwartz

We have developed a noncontact method for measurement of the interline capacitance in Cu/low-k interconnect. It is based on a miniature test vehicle with net capacitance of a few f…

cond-mat.mtrl-sci2011★ 10 cited

Noncontact electrical metrology of Cu/low-k interconnect for semiconductor production wafers

V. V. Talanov, A. Scherz, A. R. Schwartz

We have demonstrated a technique capable of in-line measurement of dielectric constant of low-k interconnect films on patterned wafers utilizing a test key of ~50x50 μm in size. Th…

cond-mat.mtrl-sci2011★ 32 cited

Noncontact dielectric constant metrology of low-k interconnect films using a near-field scanned microwave probe

Vladimir V. Talanov, André Scherz, Robert L. Moreland +1

We present a method for noncontact, noninvasive measurements of dielectric constant, k, of 100-nm- to 1.5-μm-thick blanket low-k interconnect films on up to 300 mm in diameter wafe…

cond-mat.mtrl-sci2005★ 60 cited

A near-field scanned microwave probe for spatially localized electrical metrology

Vladimir V. Talanov, Andre Scherz, Robert L. Moreland +1

We have developed a near-field scanned microwave probe with a sampling volume of approximately 10 micron in diameter, which is the smallest one achieved in near-field microwave mic…

cond-mat.str-el2000

The frequency, temperature, and magnetic field dependence of ferromagnetic resonance and anti-resonance in LaSrMnO

Andrew Schwartz, Marc Scheffler, Steven M. Anlage

Employing a broadband microwave reflection configuration, we have measured the complex surface impedance, , of single crystal LaSrMnO, as a function…

cond-mat.str-el1999★ 93 cited

Determination of the magnetization scaling exponent for single crystal LaSrMnO by broadband microwave surface impedance measurements

Andrew Schwartz, Marc Scheffler, Steven M. Anlage

Employing a broadband microwave reflection configuration, we have measured the complex surface impedance, , of single crystal LaSrMnO, as a function o…