most citedExtraction of Isotropic Electron-Nuclear Hyperfine Coupling Constants of Paramagnetic Point Defects from Near-Zero Field Magnetoresistance Spectra via Least Squares Fitting to Models Developed from the Stochastic Quantum Liouville Equation

12 citations · 16 across the 2 of their papers we have counts for

collaborators

3 papers

cond-mat.mtrl-sci2020★ 4 cited

Near-Zero-Field Spin-Dependent Recombination Current and Electrically Detected Magnetic Resonance from the Si/SiO interface

Nicholas J. Harmon, James P. Ashton, Patrick M. Lenahan +1

Dielectric interfaces critical for metal-oxide-semiconductor (MOS) electronic devices, such as the Si/SiO MOS field effect transistor (MOSFET), possess trap states that can be…

cond-mat.mtrl-sci2020★ 12 cited

Extraction of Isotropic Electron-Nuclear Hyperfine Coupling Constants of Paramagnetic Point Defects from Near-Zero Field Magnetoresistance Spectra via Least Squares Fitting to Models Developed from the Stochastic Quantum Liouville Equation

Elias B. Frantz, Nicholas J. Harmon Stephen R. McMillan, Stephen J. Moxim +2

We report on a method by which we can systematically extract spectroscopic information such as isotropic electron-nuclear hyperfine coupling constants from near-zero field magnetor…

cond-mat2000

Nature of traps responsible for failure of MOS devices

V. A. Gritsenko, P. M. Lenahan, Yu. N. Morokov +1

A failure of chips in a huge amount of modern electronic devices is connected as a rule with the undesirable capturing of charge (electrons and holes) by traps in a thin insulating…