activity
20002026
most citedExtraction of Isotropic Electron-Nuclear Hyperfine Coupling Constants of Paramagnetic Point Defects from Near-Zero Field Magnetoresistance Spectra via Least Squares Fitting to Models Developed from the Stochastic Quantum Liouville Equation

12 citations · 17 across the 6 of their papers we have counts for

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cond-mat2000★ 1 cited

Nature of traps responsible for failure of MOS devices

V. A. Gritsenko, P. M. Lenahan, Yu. N. Morokov +1

A failure of chips in a huge amount of modern electronic devices is connected as a rule with the undesirable capturing of charge (electrons and holes) by traps in a thin insulating…