2 papers
stat.ME2022
Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
Narayanaswamy Balakrishnan, Elena Castilla, María Jaenada +1
One-shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. Some kind of o…
stat.AP2020
Power divergence approach for one-shot device testing under competing risks
N. Balakrishnan, E. Castilla, N. Martin +1
Most work on one-shot devices assume that there is only one possible cause of device failure. However, in practice, it is often the case that the products under study can experienc…