2 citations · 2 across the 5 of their papers we have counts for
Showing stat.APShow all
2 papers · 1 filter
stat.AP2022★ 2 cited
Robust inference for intermittently-monitored step-stress tests under Weibull lifetime distributions
Narayanaswamy Balakrishnan, María Jaenada, Leandro Pardo
Many modern products exhibit high reliability under normal operating conditions. Conducting life tests under these conditions may result in very few observed failures, insufficient…
stat.AP2020
Power divergence approach for one-shot device testing under competing risks
N. Balakrishnan, E. Castilla, N. Martin +1
Most work on one-shot devices assume that there is only one possible cause of device failure. However, in practice, it is often the case that the products under study can experienc…