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stat.AP2022★ 2 cited
Robust inference for intermittently-monitored step-stress tests under Weibull lifetime distributions
Narayanaswamy Balakrishnan, María Jaenada, Leandro Pardo
Many modern products exhibit high reliability under normal operating conditions. Conducting life tests under these conditions may result in very few observed failures, insufficient…
stat.ME2022
Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
Narayanaswamy Balakrishnan, Elena Castilla, María Jaenada +1
One-shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. Some kind of o…