74 citations · 82 across the 3 of their papers we have counts for
3 papers
Measuring Lateral Magnetic Structure in Thin Films Using Polarized Neutron Reflectometry
W. -T. Lee, S. G. E. te Velthuis, G. P. Felcher +4
Polarized neutron reflectometry (PNR) has long been applied to measure the magnetic depth profile of thin films. In recent years, interest has increased in observing lateral magnet…
Ferromagnetic Domain Distribution in Thin Films During Magnetization Reversal
W. -T. Lee, S. G. E. te Velthuis, G. P. Felcher +3
We have shown that polarized neutron reflectometry can determine in a model-free way not only the mean magnetization of a ferromagnetic thin film at any point of a hysteresis cycle…
Decoupled Moderators - Do we always need them? or: A New Approach for Pulse Shaping
A. A. Parizzi, W. -T. Lee, G. P. Felcher +1
At a spallation neutron source, the wavelength of a neutron is generally determined by its time-of-flight (TOF) from the source to the detector. The achievable precision is ultimat…