activity
20082020
most citedPurely in-plane ferroelectricity in monolayer SnS at room temperature

393 citations · 1.3k across the 10 of their papers we have counts for

collaborators

11 papers

cond-mat.mtrl-sci2020★ 27 cited

Understanding the Memory Window Overestimation of 2D Materials Based Floating Gate Type Memory Devices by Measuring Floating Gate Voltage

Taro Sasaki, Keiji Ueno, Takashi Taniguchi +3

The memory window of floating gate (FG) type non-volatile memory (NVM) devices is a fundamental figure of merit used not only to evaluate the performance, such as retention and end…

cond-mat.mtrl-sci2020★ 393 cited

Purely in-plane ferroelectricity in monolayer SnS at room temperature

N. Higashitarumizu, H. Kawamoto, C. -J. Lee +7

2D van der Waals ferroelectric semiconductors have emerged as an attractive building block with immense potential to provide multifunctionality in nanoelectronics. Although several…

cond-mat.mtrl-sci2014★ 13 cited

Crystal orientation relation and macroscopic surface roughness in hetero-epitaxially grown graphene on Cu/mica

J. L. Qi, K. Nagashio, T. Nishimura +1

A clean, flat and orientation-identified graphene on a substrate is in high demand for graphene electronics. In this study, the hetero-epitaxial graphene growth on Cu(111)/mica(001…

cond-mat.mtrl-sci2014★ 25 cited

Large Fermi energy modulation in graphene transistors with high-pressure O2-annealed Y2O3 topgate insulators

Kaoru Kanayama, Kosuke Nagashio, Tomonori Nishimura +1

We demonstrate a considerable suppression of the low-field leakage through a Y2O3 topgate insulator on graphene by applying high-pressure O2 at 100 atm during post-deposition annea…

cond-mat.mtrl-sci2013

The density of states of graphene underneath a metal electrode and its correlation with the contact resistivity

Ryota Ifuku, Kosuke Nagashio, Tomonori Nishimura +1

The density of states (DOS) of graphene underneath a metal is estimated through a quantum capacitance measurement of the metal/graphene/SiO2/n+-Si contact structure fabricated by a…

cond-mat.mes-hall2013★ 20 cited

Carrier density modulation in graphene underneath Ni electrode

T. Moriyama, K. Nagashio, T. Nishimura +1

We investigate the transport properties of graphene underneath metal to reveal whether the carrier density in graphene underneath source/drain electrodes in graphene field-effect t…

cond-mat.mtrl-sci2013★ 40 cited

Estimation of residual carrier density near the Dirac point in graphene through quantum capacitance measurement

K. Nagashio, T. Nishimura, A. Toriumi

We discuss the residual carrier density (n*) near the Dirac point (DP) in graphene estimated by quantum capacitance (CQ) and conductivity measurements. The CQ at the DP has a finit…

cond-mat.mtrl-sci2011★ 209 cited

Electrical transport properties of graphene on SiO2 with specific surface structures

K. Nagashio, T. Yamashita, T. Nishimura +2

The mobility of graphene transferred on a SiO2/Si substrate is limited to ~10,000 cm2/Vs. Without understanding the graphene/SiO2 interaction, it is difficult to improve the electr…

cond-mat.mtrl-sci2010★ 302 cited

Contact resistivity and current flow path at metal/graphene contact

K. Nagashio, T. Nishimura, K. Kita +1

The contact properties between metal and graphene were examined. The electrical measurement on a multiprobe device with different contact areas revealed that the current flow prefe…

cond-mat.mtrl-sci2010★ 107 cited

Systematic Investigation of the Intrinsic Channel Properties and Contact Resistance of Monolayer and Multilayer Graphene FET

Kosuke Nagashio, Tomonori Nishimura, Koji Kita +1

The intrinsic channel properties of monolayer and multilayer graphene were systematically investigated as a function of layer number by the exclusion of contact resistance using fo…

cond-mat.mtrl-sci2008★ 166 cited

Mobility variations in mono- and multi-layer graphene films

Kosuke Nagashio, Tomonori Nishimura, Koji Kita +1

The electric properties of mono- and multi-layer graphene films were systematically studied with the layer number determined by their optical contrast. The current modulation incre…