activity
20192024
most citedReference-free GIXRF-XRR as a methodology for independent validation of XRR on ultrathin layer stacks and a depth-dependent characterization

37 citations · 73 across the 4 of their papers we have counts for

collaborators

4 papers

physics.comp-ph2024

Polygon-based unified Fourier-modal approach for diffractive optics simulations

K. V. Nikolaev, V. Soltwisch, M. A. Botchev +4

In this article, we derive a theoretical formalism that unifies the rigorous coupled wave analysis and the dynamical diffraction theory. Based on this formalism, we design a comput…

physics.app-ph2021★ 27 cited

Shape- and element-sensitive reconstruction of periodic nanostructures with grazing incidence X-ray fluorescence analysis and machine learning

Anna Andrle, Philipp Hönicke, Grzegorz Gwalt +4

The characterization of nanostructured surfaces with sensitivity in the sub-nm range is of high importance for the development of current and next generation integrated electronic…

physics.atom-ph2019★ 9 cited

Experimental determination of line energies, line widths and relative transition probabilities of the Gadolinium L X-ray emission spectrum

Malte Wansleben, Yves Kayser, Philipp Hönicke +4

In this work the complete L-emission spectrum of gadolinium with respect to line energies, natural line widths, and relative transition probabilities was investigated using monochr…

physics.app-ph2019★ 37 cited

Reference-free GIXRF-XRR as a methodology for independent validation of XRR on ultrathin layer stacks and a depth-dependent characterization

Philipp Hönicke, Blanka Detlefs, Yves Kayser +3

Nanolayer stacks are technologically very relevant for current and future applications in many fields of research. A non-destructive characterization of such systems is often perfo…