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physics.optics2022★ 2 cited
Transmission-matrix Quantitative Phase Profilometry for Accurate and Fast Thickness Mapping of 2D Materials
Yujie Nie, Nansen Zhou, Li Tao +4
The physical properties of two-dimensional (2D) materials may drastically vary with their thickness profiles. Current thickness profiling methods for 2D material (e.g., atomic forc…
physics.optics2019
Visualizable Detection of Nanoscale Perturbations
Jinlong Zhu, Aditi Udupa, Lynford L. Goddard
Using light to non-destructively detect nanoscale perturbations is vital to many fields including material characterization, human disease diagnosis, and semiconductor electronics.…