1.5k citations · 3.9k across the 19 of their papers we have counts for
11 papers · 1 filter
Characterizing Voltage Contrast in Photoelectron Emission Microscopy
Vinod K. Sangwan, Vincent W. Ballarotto, Karen Siegrist +1
A non-destructive technique for obtaining voltage contrast information with photoelectron emission microscopy (PEEM) is described. Samples consisting of electrically isolated metal…
Diffusive Charge Transport in Graphene on SiO2
J. -H. Chen, C. Jang, M. Ishigami +3
We review our recent work on the physical mechanisms limiting the mobility of graphene on SiO2. We have used intentional addition of charged scattering impurities and systematic va…
Dynamic interfaces in an organic thin film
Chenggang Tao, Qiang Liu, Blake C. Riddick +4
Low-dimensional boundaries between phases and domains in organic thin films are important in charge transport and recombination. Here, fluctuations of interfacial boundaries in an…
Atomic Structure of Graphene on SiO2
Masa Ishigami, J. H. Chen, W. G. Cullen +2
We employ scanning probe microscopy to reveal atomic structures and nanoscale morphology of graphene-based electronic devices (i.e. a graphene sheet supported by an insulating sili…
Effect of impurities on pentacene island nucleation
B. R. Conrad, Elba Gomar-Nadal, W. G. Cullen +3
Pentacenequinone (PnQ) impurities have been introduced into a pentacene source material in a controlled manner to quantify the relative effects of the impurity content on grain bou…
Tuning the effective fine structure constant in graphene: opposing effects of dielectric screening on short- and long-range potential scattering
C. Jang, S. Adam, J. -H. Chen +3
We reduce the dimensionless interaction strength in graphene by adding a water overlayer in ultra-high vacuum, thereby increasing dielectric screening. The mobility limited by long…