33 citations · 57 across the 5 of their papers we have counts for
Showing 2010 · cond-mat.mtrl-sciShow all
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cond-mat.mtrl-sci2010★ 8 cited
Deep level transient spectroscopy study for the development of ion-implanted silicon field-effect transistors for spin-dependent transport
B. C. Johnson, J. C. McCallum, L. H. Willems van Beveren +1
A deep level transient spectroscopy (DLTS) study of defects created by low-fluence, low-energy ion implantation for development of ion-implanted silicon field-effect transistors fo…
cond-mat.mtrl-sci2010★ 33 cited
Nano-Raman spectroscopy of silicon surfaces
P. G. Spizzirri, J. -H. Fang, S. Rubanov +2
Near-field enhanced, nano-Raman spectroscopy has been successfully used to probe the surface chemistry of silicon prepared using standard wafer cleaning and processing techniques.…