3 citations · 3 across the 2 of their papers we have counts for
2 papers
cond-mat.mes-hall2008★ 3 cited
Modeling single- and multiple-electron resonances for electric-field-sensitive scanning probes
S. H. Tessmer, I. Kuljanishvili
We have developed a modeling method suitable to analyze single- and multiple-electron resonances detected by electric-field-sensitive scanning probe techniques. The method is based…
cond-mat.mes-hall2003
Modeling electric field sensitive scanning probe measurements for a tip of arbitrary shape
I. Kuljanishvili, Subhasish Chakraborty, I . J. Maasilta +2
We present a numerical method to model electric field sensitive scanning probe microscopy measurements which allows for a tip of arbtrary shape and invokes image charges to exactly…