Modeling single- and multiple-electron resonances for electric-field-sensitive scanning probes
arXiv:0806.1899 · doi:10.1088/0957-4484/19/44/445503
Abstract
We have developed a modeling method suitable to analyze single- and multiple-electron resonances detected by electric-field-sensitive scanning probe techniques. The method is based on basic electrostatics and a numerical boundary-element approach. The results compare well to approximate analytical expressions and experimental data.
10 pages, 4 figures